X-ray Diffraction (XRD)
X-ray Diffraction (XRD) is a non-destructive analytical technique used to determine crystalline structure, phase composition, lattice spacing, crystallite size, and degree of crystallinity in materials. When a material is exposed to X-rays, its crystal lattice diffracts the beams in characteristic patterns that serve as a unique structural fingerprint.
At Materials Metric, XRD is applied to identify phases, assess crystallinity, and understand structureโproperty relationships across metals, ceramics, polymers, pharmaceuticals, battery materials, and advanced composites. Our diffraction workflows deliver reproducible peak profiles and defensible structural data supporting materials development, quality control, failure analysis, and regulatory documentation.
Use of XRD
Researchers and manufacturers use XRD to:
โข Identify and quantify crystalline phases
โข Measure crystallinity in semi-crystalline polymers
โข Detect polymorphs or phase transitions
โข Evaluate stress, strain, and lattice abnormalities
โข Determine crystallite size using Scherrer analysis
โข Characterize thin-film orientation and texture
โข Analyze battery electrode structures
Applications of XRD
โข Metals & Alloys: grain orientation, phase fractions
โข Ceramics & Glass: structural verification, purity
โข Polymers: crystallinity, polymer phase transitions
โข Battery Materials: cathode/anode phase characterization
โข Pharma: polymorph identification and stability studies
โข Thin Films & Coatings: texture, orientation, and crystallinity
Sample Analysis Process
1. Sample Submission & Review
- Identify material type (powder, film, pellet, bulk)
โข Define phases of interest or analysis goals
2. Sample Preparation
- Powder grinding or mounting
โข Thin-film orientation alignment
โข Bulk material polishing if needed
3. XRD Measurement
- ฮธโ2ฮธ scans
โข High-resolution modes for fine structures
โข Optional grazing incidence for thin films
4. Data Processing & Reporting
- Full diffraction pattern
โข Phase identification via reference libraries
โข Crystallinity and crystallite size
โข Clear summary of structural findings
Why Choose Materials Metric for Your XRD Analysis
Materials Metric offers high-resolution XRD services supported by strong expertise in structural characterization. We provide:
- Precise phase identification and quantification
โข Crystallinity analysis for polymers and composites
โข Thin-film and coating structural evaluation
โข Battery material characterization (LCO, NMC, LFP, etc.)
โข Clear, annotated diffraction reports for R&D and QC
By combining XRD data with XPS, TEM, ICP, and mechanical or thermal analysis, we help clients understand how structure relates to performance and reliability.
