X-ray Photoelectron Spectroscopy (XPS)
X-ray Photoelectron Spectroscopy (XPS) is a surface-sensitive analytical technique that measures the kinetic energy of electrons emitted from a material when irradiated with X-rays. Because the detected electrons originate from the top 5โ10 nm of the surface, XPS provides highly accurate insight into surface chemistry and interfacial composition.
At Materials Metric, XPS is used to determine elemental composition, oxidation states, and chemical bonding environments, as well as to evaluate surface contamination, coatings, and thin films. This capability is essential for understanding how surface chemistry influences adhesion, corrosion resistance, biocompatibility, catalytic activity, and coating performance across polymers, metals, ceramics, and advanced materials.
Use of XPS
XPS is used to:
โข Identify elements present on a surface
โข Determine oxidation states (e.g., Feยฒโบ/Feยณโบ, Tiโดโบ, etc.)
โข Analyze chemical bonding and functional groups
โข Evaluate plasma treatments, coatings, or surface modifications
โข Detect contamination or thin-film defects
โข Characterize corrosion layers and oxides
Applications of XPS
โข Polymers: plasma treatment verification, surface activation
โข Metals/Alloys: corrosion, oxide layer composition
โข Medical Devices: implant surface chemistry
โข Coatings/Thin Films: uniformity, chemical stability
โข Electronics: semiconductor and interface analysis
โข Catalysts: oxidation states and binding environments
Sample Analysis Process
1. Submission & Review
- Define elements/chemistries of interest
โข Provide surface history (cleaning, coating, exposure)
2. Sample Preparation
- Mounting on tabs
โข No coating required
โข Optional sputter cleaning (if appropriate)
3. XPS Measurement
- Survey scans for elemental composition
โข High-resolution (HR-XPS) scans for chemical states
โข Depth profiling (if requested)
4. Data Processing & Reporting
- Peak fitting and chemical state interpretation
โข Atomic percent composition
โข Clear discussion of surface chemistry results
Why Choose Materials Metric for Your XPS Analysis
Materials Metric provides precise XPS analysis with expert interpretation. Our services include:
- Chemical state identification for metals, polymers, and coatings
โข Surface contamination detection
โข Oxide layer and corrosion evaluation
โข Quantitative elemental and chemical composition
โข HR-XPS for detailed bonding information
โข Clear reports optimized for R&D and regulatory use
By pairing XPS with XRD, SEM, and ICP, we provide a complete understanding of both surface chemistry and bulk structure.
