Elemental Mapping & Surface Composition Profiling
(EDS, EPMA, WDS)
Elemental mapping and surface composition profiling determine the type, concentration, and spatial distribution of elements across material surfaces, interfaces, and cross-sections. By resolving elemental variations at micro- to nanoscale resolution, these analyses reveal how composition changes with depth, processing conditions, or environmental exposure.
At Materials Metric, elemental mapping leverages techniques such as EDS (Energy Dispersive X-ray Spectroscopy), EPMA, WDS, and micro-analytical X-ray methods to investigate contamination, diffusion, oxidation, coating integrity, interfacial reactions, and microstructural defects. This spatially resolved chemical insight is essential for failure analysis, quality control, material qualification, and regulatory documentation.
Uses of Elemental Mapping & Surface Composition Profiling
โข Detect elemental contamination or foreign inclusions
โข Analyze coating and thin-film uniformity
โข Assess diffusion, corrosion, and oxidation behavior
โข Map filler and additive distribution in polymers/composites
โข Evaluate material interfaces and bonding regions
โข Support failure, fracture, and delamination analysis
โข Verify batch consistency and supplier quality
Applications
โข Medical device materials and surface treatments
โข Polymers, composites, elastomers
โข Metals, alloys, and ceramics
โข Coatings, thin films, and surface modifications
โข Battery, catalyst, and energy materials
โข Packaging & food-contact materials
Sample Analysis Process
1. Objective Definition
- Identify target elements and analysis depth
- Define regions of interest or suspected defects
2. Sample Preparation
- Surface cleaning, mounting, or cross-sectioning
- Polishing for EPMA when needed
- Conductive coating (if required)
3. Elemental Mapping
- EDS mapping for rapid, multi-element visualization
- EPMA/WDS for high-accuracy, high-sensitivity elemental profiles
- Line scans & point analysis for compositional gradients
- Depth and interface mapping for coating systems
4. Reporting
- Element distribution maps
- Quantitative or semi-quantitative elemental data
- Interface, defect, or contamination interpretation
- Recommendations for corrective actions or processing adjustments
Why Choose Materials Metric for Elemental Mapping
Materials Metric provides high-resolution elemental insight using advanced micro-analytical platforms and expert scientific interpretation.
We offer:
โข Precision EDS, EPMA, and WDS mapping for accurate composition profiling
โข Deep expertise in coatings, interfaces, and microstructural defects
โข Ability to detect trace elemental deviations impacting performance
โข Audit-ready documentation for FDA, ISO, and quality systems
โข Correlation with mechanical, thermal, and chemical data for complete understanding
Materials Metric delivers clear, actionable elemental intelligence essential for material qualification, failure resolution, and product optimization.
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